October Monthly Meeting
Wednesday, October 14, 2020
Technical Forum – 6:00 pm
Business Meeting – 6:45 pm
Technical Program – 7:15 pm
SSP Technical Forum
Diane Turnshek, Department of Physics (CMU) and Department of Physics and Astronomy (Pitt)
“Dark Skies: an Endangered Natural Resource”
The US National Parks have adopted the slogan, “Half the Park Is After Dark.” Recognizing the sky is a natural resource is hard for people who live in cities and can’t see the Milky Way because of light pollution, which now comprises 80% of the population in the US. Advocacy for dark skies has many fronts: issues of public safety, human health and wellbeing, disruptions in the lives of plants and animals, concerns for astronomical research, and energy waste that raises our carbon footprint substantially and unnecessarily. It is the only form of pollution that can be fixed with the flip of a switch, so education is the key to correcting the problem. “Light Smart” means light just what you need, where you need it, at the brightness level needed and only when necessary. Consider shielding lights, using motion sensors, timers, dimmers and choosing LEDs at temperatures of 2700K or below. Don’t we all have the right to see a star-filled sky?
Diane Turnshek is a lecturer in the Department of Physics (CMU) and the Department of Physics and Astronomy (Pitt). She runs the Astronomy Public Lecture Series at Allegheny Observatory and coordinates outreach through PghConstellation.com. She’s taught astronomy at seven local schools, beginning in 1981, and been a presenter at the Buhl Planetarium. She gave a light pollution TEDxPittsburgh talk, curated a series of space art galleries, founded the local chapter of the International Dark-Sky Association (IDA) and was presented with an IDA Dark Sky Defender Award. With Chloe Nightingale, she edited the Parsec Ink 2019 anthology Triangulation: Dark Skies. She was elected to the organizing committee of the International Astronomical Union (IAU) B7 – Inter-Division B-C Commission Protection of Existing and Potential Observatory Sites and is planning an IAU meeting on light pollution in South Korea in 2021. Twitter: @dianeturnshek
SSP Technical Program
Thomas (Tom) J. Bzik, Versum Materials, Inc.
“Detecting the Detection Limit”
Detection limits have proven to be highly controversial in practice despite decades of developmental efforts by analytical scientists and regulators. This high resistance to obtaining effective and accepted detection limit solutions indicates our collective failure in how this problem is traditionally approached. The analytical chemist approaches it from analytical science, the statistician from statistical theory, the regulator from their a desire for regulatory needs, the instrument manufacturer from the standpoint of selling instruments, the contract laboratory from the standpoint of selling services, and the regulated from the standpoint of minimizing their reducing the cost of regulation. This exquisite mix of science, misapplication of science, regulatory needs, and business concerns screams part of the reason highlights why serious trouble abounds. Figuring out how to simultaneously address these constraints is not a trivial task.
Our journey of navigating the detection limit obstacle course successfully begins with a broad view of the problem focused on developing a conceptual understanding of key detection limit concepts and limitations. Throughout the presentation, key detection limit concepts, including the problems caused by our natural biases, will be explored. Issues in detection limit and rule-set application will be probed since it is at the application level that detection limit standards succeed or fail.
Tom currently works as a statistical consultant for Versum Materials, Inc. after an extended career at Air Products and Chemicals, Inc. He is Chair of ASTM – E11 Quality and Statistics which manages an extensive portfolio of international statistical standards. He chaired the Statistical Methods Task Force in SEMI International Standards for over 20 years. Tom has taught classes at several universities including his alma mater the University of Connecticut. He was the keynote speaker at ASTM’s Symposium for Detection Limits in 2018. Tom has extensively published papers and presentations with a focus on properly handling the unique data characteristics of trace contamination data. He considers difficult problems to solve “fun”.